Indium Antimonide wafer crystal substrate
 
 

InSb
Indium Antimonide
Standard specifications*
Single crystals

Dopant

Undoped

Te

Ge

Type of conductivity

n

n

p

Carrier concentration (77K), cm-3

(3 - 9)x1014

7x1014 - 1x1018

1x1015 - 5x1018

Mobility (77K), cm2/V.s

> 4x105

4x105 - 2x104

6.5x103 - 1x102

EPD, cm-2

<200

Wafers

Diameter, mm

50.8 ± 0.3

Thickness, micron

450 ± 15

Surface orientation

(100)

Orientation tolerance

± 0.5°          ± 0.1°

Off orientation

(1 - 10) ± 0.1° towards the specified face

Primary and secondary flats
according to SEMI M9 Standard (US SEMI or E/J SEMI) for (100), for other orientation - according to customer choice
Surface finishing
              face side
              back side

 "epi-ready" polished
polished or lapped and etched
Packing

Single wafer container sealed in two bags: inner bag – vaccumized, outer bag – inert gas filed

* Single crystals and wafers with nonstandard specifications are available upon request. 

[ Home page ] [III-V Semiconductor Wafers and Crystals]

GIRMET Ltd.  5, B.Tolmachevsky per., Moscow 119017, Russia
Tel: (7 495)956-0918, fax: (7 495)956-4944
E-mail: sales@girmet.com