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InSb Indium Antimonide Standard specifications* Single crystals
|
Dopant |
Undoped |
Te |
Ge |
|
Type of conductivity |
n |
n |
p |
|
Carrier concentration (77K), cm-3 |
(3 - 9)x1014 |
7x1014 - 1x1018 |
1x1015 - 5x1018 |
|
Mobility (77K), cm2/V.s |
> 4x105 |
4x105 - 2x104 |
6.5x103 - 1x102 |
|
EPD, cm-2 |
<200 |
||
Wafers |
| Diameter, mm |
50.8 ± 0.3 |
| Thickness, micron |
450 ± 15 |
| Surface
orientation |
(100) |
| Orientation
tolerance |
± 0.5° ± 0.1° |
| Off orientation |
(1 - 10) ± 0.1° towards the specified face |
Primary and secondary flats |
according to SEMI M9 Standard (US SEMI or E/J SEMI) for (100), for other orientation - according to customer choice |
Surface finishing face side back side |
"epi-ready" polished polished or lapped and etched |
| Packing |
Single wafer container sealed in two bags: inner bag – vaccumized, outer bag – inert gas filed |
* Single crystals and wafers with nonstandard specifications are available upon request.
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GIRMET Ltd.
5, B.Tolmachevsky per., Moscow 119017, Russia
Tel: (7 495)956-0918, fax: (7 495)956-4944
E-mail: sales@girmet.com