Indium Arsenide wafer crystal substrate
 
 

InAs
Indium Arsenide 
Standard specifications*
Single crystals
Dopant
Undoped
S or Sn
Zn
Type of conductivity
n
n
p
Carrier concentration,
cm-3
(1-3)x1016
1x1017 - 3x1018
5x1016 - 5x1018
Mobility, cm2/V.s
>20000
>10000
>100
EPD, cm-2
<5x104


Wafers

Diameter, mm
50.8 ± 0.3    76.2 ± 0.3 for S-doped, (100) only
Thickness,mm
450 ± 15 
Surface orientation
(100)   (111)
Orientation tolerance
   ± 0.5°          ± 0.1°
Off orientation
(1 - 10) ± 0.1° towards the specified face
Primary and secondary flats according to SEMI M9 Standard (US SEMI or E/J SEMI) for (100), for other orientation - according to customer choice
Surface finishing
                      face side
                      back side

"epi-ready" polished
polished or lapped and etched
Packing

Single wafer container sealed in two bags: inner bag – vaccumized, outer bag – inert gas filed

* Single crystals and wafers with nonstandard specifications are available upon request. 

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GIRMET Ltd.  5, B.Tolmachevsky per., Moscow 119017, Russia
Tel: (7 495)956-0918, fax: (7 495)956-4944
E-mail:
sales@girmet.com