![]()
InAs Indium Arsenide Standard specifications* Single crystals
| Dopant |
Undoped |
S or Sn |
Zn |
| Type of conductivity |
n |
n |
p |
| Carrier concentration, cm-3 |
(1-3)x1016 |
1x1017 - 3x1018 |
5x1016 - 5x1018 |
| Mobility, cm2/V.s | >20000 |
>10000 |
>100 |
| EPD, cm-2 | <5x104 |
||
|
| Diameter, mm | 50.8 ± 0.3 76.2 ± 0.3 for S-doped, (100) only |
| Thickness,mm | 450 ± 15 |
| Surface orientation | (100) (111) |
| Orientation tolerance | ± 0.5° ± 0.1° |
Off orientation |
(1 - 10) ± 0.1° towards the specified face |
| Primary and secondary flats | according to SEMI M9 Standard (US SEMI or E/J SEMI) for (100), for other orientation - according to customer choice |
| Surface finishing face side back side |
"epi-ready" polished polished or lapped and etched |
| Packing | Single wafer container sealed in two bags: inner bag – vaccumized, outer bag – inert gas filed |
* Single crystals and wafers with nonstandard specifications are available upon request.
[ Home page ] [III-V Semiconductor Wafers and Crystals]
GIRMET Ltd. 5, B.Tolmachevsky per., Moscow 119017, Russia
Tel: (7 495)956-0918, fax: (7 495)956-4944
E-mail: sales@girmet.com